Issued Patents 2003
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646350 | Semiconductor device | Naotaka Tanaka, Yoshiyuki Kado, Ikuo Yoshida, Takahiro Naito | 2003-11-11 |
| 6639315 | Semiconductor device and mounted semiconductor device structure | Atsushi Kazama, Akihiro Yaguchi | 2003-10-28 |
| 6639263 | Semiconductor device with copper wiring connected to storage capacitor | Yukihiro Kumagai, Hiroyuki Ohta, Tomio Iwasaki, Isamu Asano | 2003-10-28 |
| 6635945 | Semiconductor device having element isolation structure | Norio Ishitsuka, Shuji Ikeda, Yasuko Yoshida, Norio Suzuki, Kozo Watanabe +1 more | 2003-10-21 |
| 6624513 | Semiconductor device with multilayer conductive structure formed on a semiconductor substrate | Tomio Iwasaki, Isamu Asano | 2003-09-23 |
| 6620704 | Method of fabricating low stress semiconductor devices with thermal oxide isolation | Makoto Ogasawara, Hiroo Masuda, Jun Murata, Noriaki Okamoto | 2003-09-16 |
| 6617691 | Semiconductor device | Takashi Nakajima, Tomio Iwasaki, Hiroyuki Ohta, Shinji Nishihara, Masashi Sahara +2 more | 2003-09-09 |
| 6614246 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Toshio Miyatake | 2003-09-02 |
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2003-06-03 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Shinji Tanaka +4 more | 2003-05-20 |
| 6559037 | Process for producing semiconductor device having crystallized film formed from deposited amorphous film | Shunji Moribe, Hisayuki Kato, Atsuyoshi Koike, Shuji Ikeda, Asao Nishimura | 2003-05-06 |
| 6559027 | Semiconductor device and process for producing the sme | Norio Ishitsuka, Shuji Ikeda, Norio Suzuki, Yasushi Matsuda, Yasuko Yoshida +7 more | 2003-05-06 |
| 6554194 | IC card and its manufacturing method | Koji Sasaki, Naoto Saito, Hiroyuki Ohta, Kunio Matsumoto, Ryozo Yoshino | 2003-04-29 |
| 6548904 | Semiconductor device having a capacitor and a metal interconnect layer with tungsten as a main constituent material and containing molybdenum | Tomio Iwasaki, Takashi Nakajima, Hiroyuki Ohta, Shinji Nishihara, Masashi Sahara | 2003-04-15 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane, Hideyuki Aoki +1 more | 2003-04-15 |
| 6545362 | Semiconductor device and method of manufacturing the same | Hiroshi Moriya, Tomio Iwasaki, Shinji Nishihara, Masashi Sahara | 2003-04-08 |
| 6544884 | Semiconductor device and method of fabricating same | Hiroyuki Ohta, Kazushige Sato, Takeshi Kimura, Hiyoo Masuda | 2003-04-08 |
| 6531785 | Semiconductor device | Hiroya Shimizu, Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka | 2003-03-11 |
| 6521932 | Semiconductor device with copper wiring connected to storage capacitor | Yukihiro Kumagai, Hiroyuki Ohta, Tomio Iwasaki, Isamu Asano | 2003-02-18 |
| 6511857 | Process for manufacturing semiconductor device | Ryuji Kono, Makoto Kitano, Hiroyuki Ota, Yoshishige Endo, Takeshi Harada +5 more | 2003-01-28 |
| 6503803 | Method of fabricating a semiconductor integrated circuit device for connecting semiconductor region and electrical wiring metal via titanium silicide layer | Hiromi Todorobaru, Masayuki Suzuki, Shinji Nishihara, Shuji Ikeda, Masashi Sahara +5 more | 2003-01-07 |