Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6614246 | Probe structure | Ryuji Kohno, Hiroya Shimizu, Toshio Miyatake, Hideo Miura | 2003-09-02 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Ryuji Kohno, Hideyuki Aoki +1 more | 2003-03-11 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Ryuji Kohno, Hideyuki Aoki +1 more | 2003-01-14 |