Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6660541 | Semiconductor device and a manufacturing method thereof | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Hideyuki Aoki | 2003-12-09 |
| 6614246 | Probe structure | Tatsuya Nagata, Hiroya Shimizu, Toshio Miyatake, Hideo Miura | 2003-09-02 |
| 6611859 | Address setting method, client apparatus, server apparatus and client-server system | — | 2003-08-26 |
| 6573864 | Receiver | Yukitoshi Sanada, Masayoshi Abe | 2003-06-03 |
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada, Naoto Ban +7 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane, Hideyuki Aoki +1 more | 2003-04-15 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Hideyuki Aoki +1 more | 2003-03-11 |
| 6522898 | Radio communication system | Hiroki Mochizuki | 2003-02-18 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Hideyuki Aoki +1 more | 2003-01-14 |