Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2003-06-03 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Hideo Miura +4 more | 2003-05-20 |
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2003-04-15 |
| 6511857 | Process for manufacturing semiconductor device | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2003-01-28 |