Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661247 | Semiconductor testing device | Kazuhiro Tashiro, Makoto Haseyama, Futoshi Fukaya | 2003-12-09 |
| 6643922 | Device testing contactor, method of producing the same, and device testing carrier | Makoto Haseyama | 2003-11-11 |
| 6630839 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Makoto Haseyama | 2003-10-07 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Futoshi Fukaya, Makoto Haseyama | 2003-08-05 |
| 6563330 | Probe card and method of testing wafer having a plurality of semiconductor devices | Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2003-05-13 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Makoto Haseyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6545363 | Contactor having conductive particles in a hole as a contact electrode | Susumu Kida, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2003-04-08 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Masataka Mizukoshi, Futoshi Fukaya | 2003-03-18 |
| 6512386 | Device testing contactor, method of producing the same, and device testing carrier | Makoto Haseyama | 2003-01-28 |