Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661247 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro, Makoto Haseyama | 2003-12-09 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Makoto Haseyama | 2003-08-05 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Makoto Haseyama, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Shigeyuki Maruyama, Masataka Mizukoshi | 2003-03-18 |