Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661247 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro, Futoshi Fukaya | 2003-12-09 |
| 6643922 | Device testing contactor, method of producing the same, and device testing carrier | Shigeyuki Maruyama | 2003-11-11 |
| 6630839 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Shigeyuki Maruyama | 2003-10-07 |
| 6624645 | Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection | Masaru Tateishi | 2003-09-23 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Futoshi Fukaya | 2003-08-05 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Shigeyuki Maruyama, Masataka Mizukoshi, Futoshi Fukaya | 2003-03-18 |
| 6512386 | Device testing contactor, method of producing the same, and device testing carrier | Shigeyuki Maruyama | 2003-01-28 |