Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563330 | Probe card and method of testing wafer having a plurality of semiconductor devices | Shigeyuki Maruyama, Daisuke Koizumi, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2003-05-13 |
| 6545363 | Contactor having conductive particles in a hole as a contact electrode | Shigeyuki Maruyama, Susumu Kida, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2003-04-08 |