Issued Patents 1994
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5347854 | Two dimensional profiling with a contact force atomic force microscope | Yves Martin | 1994-09-20 |
| 5298975 | Combined scanning force microscope and optical metrology tool | Henri A. Khoury, Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein +2 more | 1994-03-29 |
| 5283442 | Surface profiling using scanning force microscopy | Yves Martin, Jordan Poler | 1994-02-01 |
| 5280341 | Feedback controlled differential fiber interferometer | Martin Nonnenmacher, deceased, Mehdi Vaez=Iravani | 1994-01-18 |