LL

Laszlo Landstein

IBM: 3 patents #119 of 3,003Top 4%
📍 Ossining, NY: #3 of 57 inventorsTop 6%
🗺 New York: #378 of 7,004 inventorsTop 6%
Overall (1994): #11,069 of 165,921Top 7%
3
Patents 1994

Issued Patents 1994

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
5345816 Integrated tip strain sensor for use in combination with a single axis atomic force microscope Joachim Clabes, Henri A. Khoury 1994-09-13
5321977 Integrated tip strain sensor for use in combination with a single axis atomic force microscope Joachim Clabes, Henri A. Khoury 1994-06-21
5298975 Combined scanning force microscope and optical metrology tool Henri A. Khoury, Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Martin P. O'Boyle +2 more 1994-03-29