CC

Calvin K. Chi

IBM: 1 patents #741 of 3,003Top 25%
📍 Elmhurst, NY: #1 of 3 inventorsTop 35%
🗺 New York: #1,860 of 7,004 inventorsTop 30%
Overall (1994): #151,579 of 165,921Top 95%
1
Patents 1994

Issued Patents 1994

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5298975 Combined scanning force microscope and optical metrology tool Henri A. Khoury, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein, Martin P. O'Boyle +2 more 1994-03-29