Issued Patents 1994
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5345816 | Integrated tip strain sensor for use in combination with a single axis atomic force microscope | Joachim Clabes, Laszlo Landstein | 1994-09-13 |
| 5321977 | Integrated tip strain sensor for use in combination with a single axis atomic force microscope | Joachim Clabes, Laszlo Landstein | 1994-06-21 |
| 5298975 | Combined scanning force microscope and optical metrology tool | Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein, Martin P. O'Boyle +2 more | 1994-03-29 |