Issued Patents All Time
Showing 26–50 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9343567 | Semiconductor device | Yi He, Jhih-Ming Wang, Lu-An Chen, Tien-Hao Tang | 2016-05-17 |
| 9331161 | Metal gate structure and method of forming the same | Chi-Ju Lee, Yao-Chang Wang, Nien-Ting Ho, Chi-Mao Hsu, Main-Gwo Chen +4 more | 2016-05-03 |
| 9331064 | Fin diode structure | Chang-Tzu Wang, Ping-Chen Chang, Tien-Hao Tang | 2016-05-03 |
| 9093565 | Fin diode structure | Chang-Tzu Wang, Ping-Chen Chang, Tien-Hao Tang | 2015-07-28 |
| 8963202 | Electrostatic discharge protection apparatus | Chang-Tzu Wang, Tien-Hao Tang | 2015-02-24 |
| 8817434 | Electrostatic discharge (ESD) protection device | Chang-Tzu Wang, Tien-Hao Tang | 2014-08-26 |
| 8711535 | ESD protection circuit and ESD protection device thereof | Chang-Tzu Wang, Tien-Hao Tang | 2014-04-29 |
| 8648421 | Electrostatic discharge (ESD) device and semiconductor structure | Yung-Ju Wen, Chang-Tzu Wang, Tien-Hao Tang | 2014-02-11 |
| 8510635 | Method for evaluating failure rate | Yun-Chi Yang, Yen-Song Liu, Chin-Hsien Chen, Sheng-Yu Wu | 2013-08-13 |
| 8467162 | ESD protection circuit and ESD protection device thereof | Chang-Tzu Wang, Tien-Hao Tang | 2013-06-18 |
| 8283941 | Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation | Sung-Nien Kuo, Yuan-Yu Hsieh, Wen-Hsiung Ko, Jih-San Lee, Kuei-Chi Juan | 2012-10-09 |
| 7759957 | Method for fabricating a test structure | Wen-Hsiung Ko, Wen-Chun Chang | 2010-07-20 |
| 7649377 | Test structure | Wen-Hsiung Ko, Wen-Chun Chang | 2010-01-19 |
| 7589551 | On-wafer AC stress test circuit | Yun-Chi Yang, Chao-Yung Lai, Chao-Yang Lin, Cheng-Li Lin | 2009-09-15 |
| 6500389 | Plasma arcing sensor | Hsiao-Pang Chou | 2002-12-31 |
| 6383883 | Method of reducing junction capacitance of source/drain region | Yao-Chin Cheng | 2002-05-07 |
| 6171899 | Method for fabricating a capacitor | Fu-Tai Liou, Water Lur, Juan-Yuan Wu | 2001-01-09 |
| 6093626 | Buried contact method to release plasma-included charging damage on device | Shing-Ren Sheu | 2000-07-25 |
| 5918127 | Method of enhancing electrostatic discharge (ESD) protection capability in integrated circuits | Chen-Wei Lee | 1999-06-29 |
| 5859460 | Tri-state read-only memory device and method for fabricating the same | Chen-Hui Chung, Yi-Chung Sheng | 1999-01-12 |
| 5756376 | Method for removing a diffusion barrier layer on pad regions | Yi-Chung Sheng, Chen-Hui Chung | 1998-05-26 |
| 5705840 | Field effect transistor with recessed buried source and drain regions | Shing-Ren Shen, Chen-Hui Chung | 1998-01-06 |
| 5693551 | Method for fabricating a tri-state read-only memory device | Chen-Hui Chung, Yi-Chung Sheng | 1997-12-02 |
| 5691234 | Buried contact method to release plasma-induced charging damage on device | Shing-Ren Sheu | 1997-11-25 |
| 5668030 | Process for making identification alphanumeric code markings for mask ROM devices | Chen-Hui Chung, Yi-Chung Sheng | 1997-09-16 |