Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8283941 | Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation | Sung-Nien Kuo, Wen-Hsiung Ko, Jih-San Lee, Kuei-Chi Juan, Kuan-Cheng Su | 2012-10-09 |