Issued Patents All Time
Showing 101–124 of 124 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10819137 | Energy harvesting wireless sensing system | Erik Volkerink | 2020-10-27 |
| 10671905 | Error based locationing of a mobile target on a road network | — | 2020-06-02 |
| 10482369 | Window based locationing of mobile targets using complementary position estimates | — | 2019-11-19 |
| 10445634 | Fabricating multifunction adhesive product for ubiquitous realtime tracking | — | 2019-10-15 |
| 10262255 | Multifunction adhesive product for ubiquitous realtime tracking | — | 2019-04-16 |
| 9146274 | Wafer boat for semiconductor testing | Duncan Gurley | 2015-09-29 |
| 8797056 | System and method for electronic testing of partially processed devices | Erik Volkerink | 2014-08-05 |
| 8005633 | Excitation signal generator for improved accuracy of model-based testing | Lee A. Barford, Nicholas Tufillaro | 2011-08-23 |
| 7948974 | Creating a low bandwidth channel within a high bandwidth packet stream | Slawomir K. Ilnicki, Gunter Steinbach | 2011-05-24 |
| 7797599 | Diagnostic information capture from logic devices with built-in self test | Klaus-Dieter Hilliges | 2010-09-14 |
| 7712000 | ATE architecture and method for DFT oriented testing | Klaus-Dieter Hilliges | 2010-05-04 |
| 7590903 | Re-configurable architecture for automated test equipment | Erik Volkerink, Hugh Wallace, Klaus-Dieter Hilliges, Jochen Rivoir | 2009-09-15 |
| 7457729 | Model based testing for electronic devices | Nicholas Tufillaro, Stanley T. Jefferson, Lee A. Barford | 2008-11-25 |
| 7378860 | Wafer test head architecture and method of use | Erik Volkerink, Duncan Gurley | 2008-05-27 |
| 7336673 | Creating a low bandwidth channel within a high bandwidth packet stream | Slawomir K. Ilnicki, Gunter Steinbach | 2008-02-26 |
| 7137053 | Bandwidth matching for scan architectures in an integrated circuit | Jochen Rivoir, David Armstrong | 2006-11-14 |
| 7131046 | System and method for testing circuitry using an externally generated signature | Erik Volkerink, Klaus-Dieter Hilliges | 2006-10-31 |
| 6842022 | System and method for heterogeneous multi-site testing | — | 2005-01-11 |
| 6732312 | Test vector compression method | Jochen Rivoir | 2004-05-04 |
| 6489802 | Digital signal transition splitting method and apparatus | Jochen Rivoir | 2002-12-03 |
| 6360344 | Built in self test algorithm that efficiently detects address related faults of a multiport memory without detailed placement and routing information | Timothy Ayres | 2002-03-19 |
| 6311317 | Pre-synthesis test point insertion | Harbinder Singh, Dhiraj Goswami, Denis Martin | 2001-10-30 |
| 6263461 | Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuit | Timothy Ayres, Amitava Majumdar | 2001-07-17 |
| 6088823 | Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuit | Timothy Ayres, Amitava Majumdar | 2000-07-11 |