RA

Rajni J. Aggarwal

TI Texas Instruments: 18 patents #707 of 12,488Top 6%
📍 Garland, TX: #50 of 1,186 inventorsTop 5%
🗺 Texas: #7,815 of 125,132 inventorsTop 7%
Overall (All Time): #250,259 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
12087813 Deep trench isolation with field oxide Abbas Ali, Steven J. Adler, Eugene C. Davis 2024-09-10
10872925 Hall sensor with buried hall plate Keith Ryan Green, Ajit Sharma 2020-12-22
10396122 Hall sensor with buried hall plate Keith Ryan Green, Ajit Sharma 2019-08-27
10339251 Method to improve transistor matching Ashesh Parikh, Chi-Chien Ho, Thomas John Smelko 2019-07-02
9818740 Method of improving bipolar device signal to noise performance by reducing the effect of oxide interface trapping centers Weidong Tian, Yuguo Wang, Tathagata Chatterjee 2017-11-14
9773793 Transistor performance modification with stressor structures Scott R. Summerfelt, Shaoping Tang 2017-09-26
9728581 Construction of a hall-effect sensor in a buried isolation region Keith Ryan Green, Ajit Sharma 2017-08-08
9698211 High sheet resistor in CMOS flow Jau-Yuann Yang 2017-07-04
9665675 Method to improve transistor matching Ashesh Parikh, Chi-Chien Ho, Thomas John Smelko 2017-05-30
9548298 Method of improving bipolar device signal to noise performance by reducing the effect of oxide interface trapping centers Weidong Tian, Yuguo Wang, Tathagata Chatterjee 2017-01-17
9536822 Drawn dummy FeCAP, via and metal structures Scott R. Summerfelt 2017-01-03
9362270 High sheet resistor in CMOS flow Jau-Yuann Yang 2016-06-07
9006838 High sheet resistor in CMOS flow Jau-Yuann Yang 2015-04-14
8609501 Fluorine implant under isolation dielectric structures to improve bipolar transistor performance and matching Weidong Tian, Ming-Yeh Chuang 2013-12-17
8580631 High sheet resistor in CMOS flow Jau-Yuann Yang 2013-11-12
8377719 Drawn dummy FeCAP, via and metal structures Scott R. Summerfelt 2013-02-19
7968878 Electrical test structure to detect stress induced defects using diodes Yuguo Wang 2011-06-28
5346851 Method of fabricating Shannon Cell circuits John N. Randall, Gary A. Frazier 1994-09-13