Issued Patents All Time
Showing 626–650 of 865 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7768305 | Quad state to two state interface circuitry with clock input | — | 2010-08-03 |
| 7770084 | Selectable JTAG or trace access with data store and output | — | 2010-08-03 |
| 7765447 | Selectively accessing test access ports in a multiple test access port environment | — | 2010-07-27 |
| 7757140 | IEEE 1149.1 and P1500 test interfaces combined circuits and processes | — | 2010-07-13 |
| 7747918 | JTAG bus communication method and apparatus | — | 2010-06-29 |
| 7747919 | BIST scan path parts with test generator and compactor circuitry | — | 2010-06-29 |
| 7739569 | Boundary scan path method and system with functional and non-functional scan cell memories | — | 2010-06-15 |
| 7734971 | Scan output connection in tap and scan test port | — | 2010-06-08 |
| 7733110 | Parallel scan distributors and collectors and process of testing integrated circuits | — | 2010-06-08 |
| 7725791 | Single lead alternating TDI/TMS DDR JTAG input | — | 2010-05-25 |
| 7725790 | Selectable dual mode test access port method and apparatus | — | 2010-05-25 |
| 7720186 | Plural circuit selection using role reversing control inputs | — | 2010-05-18 |
| 7701249 | IC output signal path with switch, bus holder, and buffer | — | 2010-04-20 |
| 7698614 | Serial I/O using JTAG TCK and TMS signals | — | 2010-04-13 |
| 7698612 | Direct scan access JTAG | — | 2010-04-13 |
| 7694199 | Three boundary scan cell switches controlling input to output buffer | — | 2010-04-06 |
| 7669099 | Optimized JTAG interface | — | 2010-02-23 |
| 7661049 | Integrated circuit with JTAG port, TAP linking module, and off-chip TAP interface port | — | 2010-02-09 |
| 7659741 | Parallel scan distributors and collectors and process of testing integrated circuits | — | 2010-02-09 |
| 7657811 | Low power testing of very large circuits | — | 2010-02-02 |
| 7657810 | Scan testing using scan frames with embedded commands | — | 2010-02-02 |
| 7657808 | Propagation test strobe circuitry with boundary scan circuitry | — | 2010-02-02 |
| 7657806 | Position independent testing of circuits | — | 2010-02-02 |
| 7657790 | Scan frame based test access mechanisms | — | 2010-02-02 |
| 7655946 | IC with comparator receiving expected and mask data from pads | Alan Hales | 2010-02-02 |