Issued Patents All Time
Showing 426–450 of 865 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8566659 | Generator and compactor adaptor for low power divided scan path | — | 2013-10-22 |
| 8560905 | Programmable test compression architecture with serial input register and multiplexer | — | 2013-10-15 |
| 8539291 | Circuits with selectable paths of control and data scan cells | — | 2013-09-17 |
| 8539295 | Executing TAP instructions in IP core with ERP lead | — | 2013-09-17 |
| 8539294 | Decode logic driving segmented scan cells with clocks and enables | Jayashree Saxena | 2013-09-17 |
| 8527823 | Gating of clock-DR and pause-DR from TAP to TCA | — | 2013-09-03 |
| 8522092 | Compare circuitry with scan cell separate from serial scan circuitry | — | 2013-08-27 |
| 8522094 | Test access and scan test ports with lockout signal terminal | — | 2013-08-27 |
| 8522098 | Scan register and flip-flop alternately receiving SDI and mask data | — | 2013-08-27 |
| 8522095 | Tap with address, state monitor and gating circuitry | — | 2013-08-27 |
| 8516321 | IC with addressable test access port domain selection circuitry | — | 2013-08-20 |
| 8516319 | TAPS and hierarchical TLM with shift register and state machines | — | 2013-08-20 |
| 8516320 | Output linking circuitry for multiple TAP domains | Baher Haroun, Brian J. Lasher, Anjali Vij | 2013-08-20 |
| 8473795 | IC with wrapper, TAM, TAM controller, and DDR circuitry | — | 2013-06-25 |
| 8473794 | First, update, and second TDI and TMS flip-flop TAP circuitry | — | 2013-06-25 |
| 8468403 | Data register control from TAP+ATC or discrete WSP signals | — | 2013-06-18 |
| 8466464 | Test and enable circuitry connected between embedded die circuits | Richard L. Antley | 2013-06-18 |
| 8468406 | Access port selector and gating selecting test access port | — | 2013-06-18 |
| 8464114 | IC TAP with IR select output and controller enable input | — | 2013-06-11 |
| 8464116 | Logic 1 and 0 formatter inputs for parallel scan paths | — | 2013-06-11 |
| 8464112 | Wrapper selection circuits with selection and enable inputs | — | 2013-06-11 |
| 8464110 | State machine transitioning states from sequence 3 to idle 2 | — | 2013-06-11 |
| 8464109 | Pad switch cells selectively coupling test leads to test pads | — | 2013-06-11 |
| 8464108 | Scan collector and parallel scan paths with controlled output buffer | — | 2013-06-11 |
| 8461872 | Two LVDS comparators controlling multiplexer | — | 2013-06-11 |