Issued Patents All Time
Showing 26–50 of 108 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9032706 | Composite fan case with integral containment zone | — | 2015-05-19 |
| 8868922 | Wireless authorization mechanism for mobile devices and data thereon | Tito Gelsomini, Harvey Edd Davis | 2014-10-21 |
| 8686744 | Precision measurement of capacitor mismatch | Md. Imran Hossain, Michelle Nguyen | 2014-04-01 |
| 8581317 | SOI MuGFETs having single gate electrode level | Howard L. Tigelaar, Cloves Rinn Cleavelin, Weize Xiong | 2013-11-12 |
| 8519753 | Frequency doubler/inverter | — | 2013-08-27 |
| 8500390 | Fan case with rub elements | Czeslaw Wojtyczka | 2013-08-06 |
| 8455305 | Programmable circuit with carbon nanotube | Tito Gelsomini, Harvey Edd Davis | 2013-06-04 |
| 8337630 | Method for cleaning the compressor of a gas turbine engine | Julien de la Bruère-Terreault | 2012-12-25 |
| 8304263 | Test circuit allowing precision analysis of delta performance degradation between two logic chains | — | 2012-11-06 |
| 8258868 | Differential input for ambipolar devices | — | 2012-09-04 |
| 8245952 | Compressor wash nozzle integrated in an inlet case strut | Julien de la Bruère-Terreault | 2012-08-21 |
| 8217322 | Temperature responsive back bias control for integrated circuit | Theodore W. Houston | 2012-07-10 |
| 8202041 | Fan case for turbofan engine | Czeslaw Wojtyczka | 2012-06-19 |
| 8174058 | Integrated circuits with split gate and common gate FinFET transistors | Theodore W. Houston | 2012-05-08 |
| 8067792 | Memory device with memory cell including MuGFET and FIN capacitor | Weize Xiong, Cloves Rinn Cleavelin, Howard L. Tigelaar | 2011-11-29 |
| 8058161 | Recessed STI for wide transistors | Gabriel G. Barna, Brian K. Kirkpatrick | 2011-11-15 |
| 8049214 | Degradation correction for finFET circuits | — | 2011-11-01 |
| 8018780 | Temperature dependent back-bias for a memory array | Theodore W. Houston | 2011-09-13 |
| 7978004 | Body bias coordinator, method of coordinating a body bias and sub-circuit power supply employing the same | Theodore W. Houston | 2011-07-12 |
| 7974595 | Methodology for assessing degradation due to radio frequency excitation of transistors | Vijay Reddy, Siraj Akhtar, Srikanth Krishnan, Karan Singh Bhatia | 2011-07-05 |
| 7960760 | Electrically programmable fuse | — | 2011-06-14 |
| 7952378 | Tunable stress technique for reliability degradation measurement | Vijay Reddy | 2011-05-31 |
| 7907456 | Memory having circuitry controlling the voltage differential between the word line and array supply voltage | Theodore W. Houston | 2011-03-15 |
| 7893723 | Minimizing leakage in logic designs | — | 2011-02-22 |
| 7888192 | Process for forming integrated circuits with both split gate and common gate FinFET transistors | Theodore W. Houston | 2011-02-15 |