Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6774046 | Method for minimizing the critical dimension growth of a feature on a semiconductor wafer | Stephen P. DeOrnellas, Alferd Cofer, Leslie G. Jerde, Kurt A. Olson | 2004-08-10 |
| 6492280 | Method and apparatus for etching a semiconductor wafer with features having vertical sidewalls | Stephen P. DeOrnellas, Alferd Cofer | 2002-12-10 |
| 6127277 | Method and apparatus for etching a semiconductor wafer with features having vertical sidewalls | Stephen P. DeOrnellas, Alferd Cofer | 2000-10-03 |
| 6046116 | Method for minimizing the critical dimension growth of a feature on a semiconductor wafer | Stephen P. DeOrnellas, Alfred Cofer, Leslie G. Jerde, Kurt A. Olson | 2000-04-04 |