Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Roberto Crippa — 20 Patents

TSTechnoprobe S.P.A.: 17 patents #1 of 22Top 5%
ALAlcatel: 2 patents #603 of 2,861Top 25%
Merate, IT: #5 of 178 inventorsTop 3%
Overall (All Time): #214,803 of 4,157,543Top 6%
20 Patents All Time
Roberto Crippa has been granted 20 US patents while listed as an inventor at Technoprobe S.P.A.. The first was granted in 2006 and the most recent in October 2025. Roberto Crippa ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Roberto Crippa in Merate, IT.

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12455299 Contact element for a probe head for testing high-frequency electronic devices and relating probe head 2025-10-28
12105118 Testing head with an improved contact between contact probes and guide holes 2024-10-01
12032003 Probe head for electronic devices and corresponding probe card 2024-07-09
12019111 Manufacturing method of a multi-layer for a probe card Flavio Maggioni, Raffaele Vallauri 2024-06-25
11953522 Probe head for reduced-pitch applications Stefano Felici 2024-04-09
11828774 Testing head with improved frequency property Flavio Maggioni 2023-11-28
11442080 Contact probe and relative probe head of an apparatus for testing electronic devices Raffaele Vallauri 2022-09-13
11340262 Contact probe for a testing head for testing high-frequency devices Flavio Maggioni, Andrea Calaon 2022-05-24
11293941 Interface element for a testing apparatus of electronic devices and corresponding manufacturing method Riccardo Vettori 2022-04-05
11029337 Vertical probe testing head with improved frequency properties Raffaele Vallauri 2021-06-08
11016122 Contact probe and relative probe head of an apparatus for testing electronic devices Raffaele Vallauri 2021-05-25
10782319 Probe card for electronics devices Stefano Felici 2020-09-22
10551433 Testing head comprising vertical probes Raffaele Vallauri, Emanuele Bertarelli, Daniele Perego 2020-02-04
10365299 Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product Giuseppe Crippa 2019-07-30
10228392 Contact probe for a testing head Giuseppe Crippa, Raffaele Vallauri 2019-03-12
10151775 High-planarity probe card for a testing apparatus for electronic devices Riccardo Liberini, Filippo Dell'Orto 2018-12-11
9829508 Testing head of electronic devices Stefano Felici, Raffaele Vallauri 2017-11-28
9429593 Testing head for a test equipment of electronic devices 2016-08-30
7465175 System for unmating a connector pair Roberto Maltecca, Roberto Omati 2008-12-16 $1,629,000
7004779 Device for hooking/unhooking LC connectors Maurizio Oreglio 2006-02-28 $2,274,000