Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Contact probe and relative probe head of an apparatus for testing electronic devices

Contact probe and relative probe head of an apparatus for testing electronic devices

US Patent 11016122 · Granted May 25, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Contact element for a probe head for testing high-frequency electronic devices a2025
Testing head with an improved contact between contact probes and guide holes2024
Contact probe for high-frequency applications with improved current capacity2024
Probe head for electronic devices and corresponding probe card2024
Manufacturing method of a multi-layer for a probe card2024
Manufacturing method of a multi-layer for a probe card2024
Probe head for reduced-pitch applications2024
Testing head with improved frequency property2023
Contact probe and relative probe head of an apparatus for testing electronic dev2022
Contact probe and relative probe head of an apparatus for testing electronic dev2022
Contact probe for a testing head for testing high-frequency devices2022
Interface element for a testing apparatus of electronic devices and correspondin2022