| 12044703 |
Contact probe for high-frequency applications with improved current capacity |
Fabio MORGANA |
2024-07-23 |
| 12019111 |
Manufacturing method of a multi-layer for a probe card |
Roberto Crippa, Flavio Maggioni |
2024-06-25 |
| 11442080 |
Contact probe and relative probe head of an apparatus for testing electronic devices |
Roberto Crippa |
2022-09-13 |
| 11029337 |
Vertical probe testing head with improved frequency properties |
Roberto Crippa |
2021-06-08 |
| 11016122 |
Contact probe and relative probe head of an apparatus for testing electronic devices |
Roberto Crippa |
2021-05-25 |
| 10551433 |
Testing head comprising vertical probes |
Roberto Crippa, Emanuele Bertarelli, Daniele Perego |
2020-02-04 |
| 10509056 |
Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications |
Riccardo Liberini, Giuseppe Crippa |
2019-12-17 |
| 10401387 |
Manufacturing method of contact probes for a testing head |
— |
2019-09-03 |
| 10386388 |
Contact probe and corresponding testing head |
Daniele Acconcia |
2019-08-20 |
| 10228392 |
Contact probe for a testing head |
Roberto Crippa, Giuseppe Crippa |
2019-03-12 |
| 9829508 |
Testing head of electronic devices |
Stefano Felici, Roberto Crippa |
2017-11-28 |