Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044703 | Contact probe for high-frequency applications with improved current capacity | Fabio MORGANA | 2024-07-23 |
| 12019111 | Manufacturing method of a multi-layer for a probe card | Roberto Crippa, Flavio Maggioni | 2024-06-25 |
| 11442080 | Contact probe and relative probe head of an apparatus for testing electronic devices | Roberto Crippa | 2022-09-13 |
| 11029337 | Vertical probe testing head with improved frequency properties | Roberto Crippa | 2021-06-08 |
| 11016122 | Contact probe and relative probe head of an apparatus for testing electronic devices | Roberto Crippa | 2021-05-25 |
| 10551433 | Testing head comprising vertical probes | Roberto Crippa, Emanuele Bertarelli, Daniele Perego | 2020-02-04 |
| 10509056 | Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications | Riccardo Liberini, Giuseppe Crippa | 2019-12-17 |
| 10401387 | Manufacturing method of contact probes for a testing head | — | 2019-09-03 |
| 10386388 | Contact probe and corresponding testing head | Daniele Acconcia | 2019-08-20 |
| 10228392 | Contact probe for a testing head | Roberto Crippa, Giuseppe Crippa | 2019-03-12 |
| 9829508 | Testing head of electronic devices | Stefano Felici, Roberto Crippa | 2017-11-28 |