Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12085588 | Vertical probe head with improved contact properties towards a device under test | — | 2024-09-10 |
| 11953522 | Probe head for reduced-pitch applications | Roberto Crippa | 2024-04-09 |
| 11867723 | Vertical probe head having an improved contact with a device under test | — | 2024-01-09 |
| 11821918 | Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positions | Michael S. Lockard, Uri Frodis, Dennis R. Smalley | 2023-11-21 |
| 11112431 | Probe card for high-frequency applications | — | 2021-09-07 |
| 11029336 | Probe card for high-frequency applications | Riccardo Vettori | 2021-06-08 |
| 10782319 | Probe card for electronics devices | Roberto Crippa | 2020-09-22 |
| 9829508 | Testing head of electronic devices | Raffaele Vallauri, Roberto Crippa | 2017-11-28 |
| 7301354 | Contact probe for a testing head having vertical probes for semiconductor integrated devices | Giuseppe Crippa | 2007-11-27 |
| 7227368 | Testing head contact probe with an eccentric contact tip | Giuseppe Crippa | 2007-06-05 |
| 6768327 | Testing head having vertical probes for semiconductor integrated electronic devices | Giuseppe Crippa | 2004-07-27 |
| 6674298 | Testing head having cantilever probes | Giuseppe Crippa | 2004-01-06 |
| 6515496 | Microstructure testing head | Giuseppe Crippa | 2003-02-04 |