Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131690 | Contact probe for testing head | — | 2021-09-28 |
| 10509056 | Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications | Riccardo Liberini, Raffaele Vallauri | 2019-12-17 |
| 10365299 | Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product | Roberto Crippa | 2019-07-30 |
| 10228392 | Contact probe for a testing head | Roberto Crippa, Raffaele Vallauri | 2019-03-12 |
| 7301354 | Contact probe for a testing head having vertical probes for semiconductor integrated devices | Stefano Felici | 2007-11-27 |
| 7227368 | Testing head contact probe with an eccentric contact tip | Stefano Felici | 2007-06-05 |
| 6768327 | Testing head having vertical probes for semiconductor integrated electronic devices | Stefano Felici | 2004-07-27 |
| 6674298 | Testing head having cantilever probes | Stefano Felici | 2004-01-06 |
| 6515496 | Microstructure testing head | Stefano Felici | 2003-02-04 |