Issued Patents All Time
Showing 26–50 of 95 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11063080 | Implant damage free image sensor and method of the same | Alexander Kalnitsky, Jhy-Jyi Sze, Dun-Nian Yaung, Chen-Jong Wang, Yuichiro Yamashita | 2021-07-13 |
| 11018169 | Metal-insulator-metal capacitor structure to increase capacitance density | — | 2021-05-25 |
| 11004880 | Semiconductor imaging device having improved dark current performance | Seiji Takahashi, Chen-Jong Wang, Dun-Nian Yaung, Feng-Chi Hung, Feng-Jia Shiu +5 more | 2021-05-11 |
| 10991746 | High performance image sensor | Tung-Ting Wu, Jhy-Jyi Sze | 2021-04-27 |
| 10868071 | Method for forming semiconductor image sensor | Jhy-Jyi Sze, Dun-Nian Yaung | 2020-12-15 |
| 10854647 | Photo diode with dual backside deep trench isolation depth | — | 2020-12-01 |
| 10797091 | Semiconductor imaging device having improved dark current performance | Seiji Takahashi, Chen-Jong Wang, Dun-Nian Yaung, Feng-Chi Hung, Feng-Jia Shiu +5 more | 2020-10-06 |
| 10720361 | Methods and apparatus for MOS capacitors in replacement gate process | Pai-Chieh Wang, Tung-Heng Hsieh, Chung-Hui Chen | 2020-07-21 |
| 10692914 | Implant damage free image sensor and method of the same | Alexander Kalnitsky, Jhy-Jyi Sze, Dun-Nian Yaung, Chen-Jong Wang, Yuichiro Yamashita | 2020-06-23 |
| 10641185 | System and method for monitoring hot gas path hardware life | Hua Zhang, Timothy Andrew Healy, Iris Hu | 2020-05-05 |
| 10468448 | Semiconductor image sensor and method for forming the same | Sze Jhy-Jyi, Dun-Nian Yaung | 2019-11-05 |
| 10354920 | Methods and apparatus for MOS capacitors in replacement gate process | Pai-Chieh Wang, Tung-Heng Hsieh, Chung-Hui Chen | 2019-07-16 |
| 10177187 | Implant damage free image sensor and method of the same | Alexander Kalnitsky, Jhy-Jyi Sze, Dun-Nian Yaung, Chen-Jong Wang, Yuichiro Yamashita | 2019-01-08 |
| 10163724 | Integrated circuit device and method of manufacturing same | Pai-Chieh Wang | 2018-12-25 |
| 10164093 | Semiconductor device including an epitaxy region | Te-Jen Pan, Yu-Hsien Lin, Hsiang-Ku Shen, Wei-Han Fan, Yun Jing Lin +1 more | 2018-12-25 |
| 10128293 | Self-aligned back side deep trench isolation structure | Jhy-Jyi Sze, Alexander Kalnitsky | 2018-11-13 |
| 9818788 | Vertical transfer gate structure for a back-side illumination (BSI) complementary metal-oxide-semiconductor (CMOS) image sensor using global shutter capture | Jhy-Jyi Sze, Alexander Kalnitsky | 2017-11-14 |
| 9768218 | Self-aligned back side deep trench isolation structure | Jhy-Jyi Sze, Alexander Kalnitsky | 2017-09-19 |
| 9698057 | Method of manufacturing strained source/drain structures | Chun-Feng Nieh, Ming-Huan Tsai, Wei-Han Fan, Chun-Fai Cheng, Han-Ting Tsai +1 more | 2017-07-04 |
| 9595477 | Semiconductor device including an epitaxy region | Te-Jen Pan, Yu-Hsien Lin, Hsiang-Ku Shen, Wei-Han Fan, Yun Jing Lin +1 more | 2017-03-14 |
| 9570613 | Structure and formation method of FinFET device | Kai-Hsuan Lee, Cheng-Yu Yang, Hsiang-Ku Shen, Han-Ting Tsai | 2017-02-14 |
| 9515116 | Vertical transfer gate structure for a back-side illumination (BSI) complementary metal-oxide-semiconductor (CMOS) image sensor using global shutter capture | Jhy-Jyi Sze, Alexander Kalnitsky | 2016-12-06 |
| 9496264 | Structure and formation method of FinFET device | Kai-Hsuan Lee, Cheng-Yu Yang, Hsiang-Ku Shen, Han-Ting Tsai | 2016-11-15 |
| 9412883 | Methods and apparatus for MOS capacitors in replacement gate process | Pai-Chieh Wang, Tung-Heng Hsieh, Chung-Hui Chen | 2016-08-09 |
| 9269833 | Methods and apparatus for hybrid MOS capacitors in replacement gate process | Pai-Chieh Wang, Tung-Heng Hsieh | 2016-02-23 |