WL

Wei-Yang Lee

TSMC: 191 patents #83 of 12,232Top 1%
NU National Taiwan University: 2 patents #404 of 2,195Top 20%
Overall (All Time): #3,611 of 4,157,543Top 1%
193
Patents All Time

Issued Patents All Time

Showing 101–125 of 193 patents

Patent #TitleCo-InventorsDate
11515211 Cut EPI process and structures Feng-Ching Chu, Chia-Pin Lin 2022-11-29
11508736 Method for forming different types of devices Feng-Ching Chu, Feng-Cheng Yang, Yen-Ming Chen 2022-11-22
11508827 Air spacer for a gate structure of a transistor Yi-Hsiu Liu, Feng-Cheng Yang, Tsung-Lin Lee, Yen-Ming Chen, Yen-Ting Chen 2022-11-22
11502005 Semiconductor devices and methods of forming the same Feng-Ching Chu, Feng-Cheng Yang, Yen-Ming Chen 2022-11-15
11502182 Selective gate air spacer formation Chih-Hsin Yang, Yen-Ming Chen, Feng-Cheng Yang, Tsung-Lin Lee, Dian-Hau Chen 2022-11-15
11495606 FinFET having non-merging epitaxially grown source/drains Chun Po Chang, Chen-Ming Lee, Fu-Kai Yang, Mei-Yun Wang, Tzu-Hsiang Hsu 2022-11-08
11488874 Semiconductor device with funnel shape spacer and methods of forming the same Cheng-Yu Yang, Yen-Ting Chen, Fu-Kai Yang, Yen-Ming Chen 2022-11-01
11456295 Air gap formation between gate spacer and epitaxy structure Bo-Yu Lai, Kai-Hsuan Lee, Feng-Cheng Yang, Yen-Ming Chen 2022-09-27
11450559 Integrated circuit structure with backside dielectric layer having air gap Che-Lun Chang, Chia-Pin Lin, Yuan-Ching Peng 2022-09-20
11444162 Backside contact with air spacer Chen-Ming Lee 2022-09-13
11444178 Inner spacer liner Jin-Mu Yin, Chih-Hao Yu, Yen-Ting Chen, Chia-Pin Lin 2022-09-13
11417767 Semiconductor devices including backside vias and methods of forming the same Che-Lun Chang, Chia-Pin Lin, Yuan-Ching Peng 2022-08-16
11398553 Source/drain features Ruei-Ping Lin, Kai-Di Tzeng, Chen-Ming Lee 2022-07-26
11387322 Semiconductor device having nanosheet transistor and methods of fabrication thereof Chih-Ching Wang, Ming-Chang Wen, Jo-Tzu HUNG, Wen-Hsing Hsieh, Kuan-Lun Cheng 2022-07-12
11374128 Method and structure for air gap inner spacer in gate-all-around devices Shih-Chiang Chen, Chia-Pin Lin, Yuan-Ching Peng 2022-06-28
11362199 Semiconductor device and method I-Hsieh Wong, Yen-Ting Chen, Feng-Cheng Yang, Yen-Ming Chen 2022-06-14
11355400 Using a metal-containing layer as an etching stop layer and to pattern source/drain regions of a FinFET Yen-Ting Chen, Feng-Cheng Yang, Yen-Ming Chen 2022-06-07
11328960 Semiconductor structure with gate-all-around devices and stacked FinFET devices Feng-Ching Chu, Chia-Pin Lin 2022-05-10
11296077 Transistors with recessed silicon cap and method forming same Yen-Ting Chen, Bo-Yu Lai, Chien-Wei Lee, Hsueh-Chang Sung, Feng-Cheng Yang +1 more 2022-04-05
11289574 Methods of forming epitaxial source/drain features in semiconductor devices Tzu-Hsiang Hsu, Ting-Yeh Chen, Feng-Cheng Yang, Yen-Ming Chen 2022-03-29
11257928 Method for epitaxial growth and device Tzu-Hsiang Hsu, Ting-Yeh Chen, Feng-Cheng Yang, Yen-Ming Chen 2022-02-22
11217490 Source/drain features with an etch stop layer Feng-Ching Chu, Feng-Cheng Yang, Yen-Ming Chen 2022-01-04
11217486 Semiconductor device and method Cheng-Yu Yang, Feng-Cheng Yang, Yen-Ming Chen, Yen-Ting Chen 2022-01-04
11211455 Formation of dislocations in source and drain regions of FinFET devices Chun Hsiung Tsai, Wei-Yuan Lu, Chien-Tai Chan, Da-Wen Lin 2021-12-28
11205597 Semiconductor device and method Wei-Chun Tan, I-Hsieh Wong, Te-En Cheng, Yung-Hui Lin, Wei-Ken Lin +1 more 2021-12-21