Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7952142 | Variable width offset spacers for mixed signal and system on chip devices | — | 2011-05-31 |
| 7898028 | Process for fabricating a strained channel MOSFET device | Sun-Jay Chang | 2011-03-01 |
| 7892895 | Diode junction poly fuse | Shi-Bai Chen | 2011-02-22 |
| 7782073 | High accuracy and universal on-chip switch matrix testline | Tseng Chin Lo, Kuo-Tsai Li | 2010-08-24 |
| 7678655 | Spacer layer etch method providing enhanced microelectronic device performance | Hung-Der Su, Ju-Wang Hsu, Yi-Chun Huang, Yung-Shun Chen, Tung-Heng Shie +3 more | 2010-03-16 |
| 7456066 | Variable width offset spacers for mixed signal and system on chip devices | — | 2008-11-25 |
| 7332791 | Electrically programmable polysilicon fuse with multiple level resistance and programming | — | 2008-02-19 |
| 7279430 | Process for fabricating a strained channel MOSFET device | Sun-Jay Chang | 2007-10-09 |
| 7271431 | Integrated circuit structure and method of fabrication | Chuan-Yi Lin, Yee-Chia Yeo | 2007-09-18 |
| 7109564 | Low power fuse structure and method of making the same | Shi-Bai Chen | 2006-09-19 |
| 7078723 | Microelectronic device with depth adjustable sill | Chuan-Yi Lin, Wen-Chin Lee, Sun-Jay Chang | 2006-07-18 |
| 6970394 | Programming method for electrical fuse cell and circuit thereof | Jhon Jhy Liaw | 2005-11-29 |
| 6956277 | Diode junction poly fuse | Shi-Bai Chen | 2005-10-18 |
| 6885214 | Method for measuring capacitance-voltage curves for transistors | Hung-Der Su, Yung-Shun Chen, Kuan-Yao Wang, Sun-Jay Chang | 2005-04-26 |
| 6828198 | System-on-chip (SOC) solutions with multiple devices by multiple poly gate trimming process | Hung-Der Su, Yung-Shun Chen, Tung-Heng Shie, Yuan-Hung Chiu | 2004-12-07 |
| 6806107 | Electrical fuse element test structure and method | — | 2004-10-19 |
| 6580145 | Low programming voltage anti-fuse structure | Ta-Lee Yu | 2003-06-17 |
| 6323097 | Electrical overlay/spacing monitor method using a ladder resistor | Tseng Chin Lo, Konrad Young | 2001-11-27 |