SG

Santiago Serrano Guisan

TSMC: 7 patents #3,492 of 12,232Top 30%
HT Headway Technologies: 4 patents #135 of 309Top 45%
📍 San Jose, CA: #5,837 of 32,062 inventorsTop 20%
🗺 California: #55,401 of 386,348 inventorsTop 15%
Overall (All Time): #447,085 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11683994 Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio Luc Thomas, Jodi Mari Iwata, Guenole Jan, Ru-Ying Tong 2023-06-20
11609296 Method for measuring saturation magnetization of magnetic films and multilayer stacks Luc Thomas, Guenole Jan, Son Le 2023-03-21
11397226 Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devices Guenole Jan, Son Le, Luc Thomas 2022-07-26
11264560 Minimal thickness, low switching voltage magnetic free layers using an oxidation control layer and magnetic moment tuning layer for spintronic applications Jodi Mari Iwata, Guenole Jan, Luc Thomas, Ru-Ying Tong 2022-03-01
11264566 Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio Luc Thomas, Jodi Mari Iwata, Guenole Jan, Ru-Ying Tong 2022-03-01
11237240 Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films Luc Thomas, Son Le, Guenole Jan 2022-02-01
11092661 Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers Luc Thomas, Son Le, Guenole Jan 2021-08-17
10950782 Nitride diffusion barrier structure for spintronic applications Luc Thomas, Jodi Mari Iwata, Guenole Jan, Vignesh Sundar 2021-03-16
10788561 Method for measuring saturation magnetization of magnetic films and multilayer stacks Luc Thomas, Guenole Jan, Son Le 2020-09-29
10754000 Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films Luc Thomas, Son Le, Guenole Jan 2020-08-25
10401464 Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers Luc Thomas, Son Le, Guenole Jan 2019-09-03