Issued Patents All Time
Showing 51–75 of 100 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9105634 | Voids in interconnect structures and methods for forming the same | Jiun-Jie Huang | 2015-08-11 |
| 9099421 | Surface profile for semiconductor region | Chao-Hsuing Chen, Chi-Yen Lin | 2015-08-04 |
| 9076751 | Semiconductor devices with self-heating structures, methods of manufacture thereof, and testing methods | Jia-Yang Ko, Ying-Han Chiou | 2015-07-07 |
| 9064841 | Metal-oxide-metal capacitor apparatus with a via-hole region | Jiun-Jie Huang, Chi-Yen Lin | 2015-06-23 |
| 9053974 | SRAM cells with dummy insertions | Chao-Hsuing Chen, Chi-Yen Lin | 2015-06-09 |
| 9024391 | Semiconductor structure having stressor | Mei-Hsuan Lin, Chih-Hsun Lin, Chih-Kang Chao | 2015-05-05 |
| 8994097 | MOS devices having non-uniform stressor doping | Mei-Hsuan Lin, Chih-Hsun Lin, Ching-Hua Chu | 2015-03-31 |
| 8940594 | Semiconductor device having v-shaped region | Chao-Hsuing Chen, Chi-Yen Lin | 2015-01-27 |
| 8900886 | System and method of monitoring and controlling atomic layer deposition of tungsten | Kun-Ei Chen, Jen-Yi Chen, Yi-Chung Lin, Chen-Chieh Chiang | 2014-12-02 |
| 8846492 | Integrated circuit having a stressor and method of forming the same | Mei-Hsuan Lin, Chih-Hsun Lin, Chih-Kang Chao | 2014-09-30 |
| 8836088 | Semiconductor structure having etch stop layer | Mei-Hsuan Lin, Chih-Hsun Lin, Chih-Kang Chao | 2014-09-16 |
| 8775982 | Optical proximity correction for active region design layout | Mei-Hsuan Lin, Chih-Chan Lu, Chih-Hsun Lin, Chih-Kang Chao, Jen-Pan Wang | 2014-07-08 |
| 8765545 | Method of manufacturing a semiconductor device | Mei-Hsuan Lin, Chih-Kang Chao, Chih-Hsun Lin | 2014-07-01 |
| 8766256 | SiGe SRAM butted contact resistance improvement | Chao-Hsuing Chen, Chi-Yen Lin | 2014-07-01 |
| 8659089 | Nitrogen passivation of source and drain recesses | Jia-Yang Ko, Ching-Chien Huang, Ying-Han Chiou | 2014-02-25 |
| 8586486 | Method for forming semiconductor device | Jen-Yi Chen, Kun-Ei Chen, Chen-Chieh Chiang | 2013-11-19 |
| 8558350 | Metal-oxide-metal capacitor structure | Jiun-Jie Huang, Chi-Yen Lin | 2013-10-15 |
| 8533639 | Optical proximity correction for active region design layout | Mei-Hsuan Lin, Chih-Chan Lu, Chih-Hsun Lin, Chih-Kang Chao, Jen-Pan Wang | 2013-09-10 |
| 8527915 | Method and system for modifying doped region design layout during mask preparation to tune device performance | Mei-Hsuan Lin, Chih-Hsun Lin, Chih-Kang Chao | 2013-09-03 |
| 8513143 | Semiconductor structure and method of manufacturing | Mei-Hsuan Lin, Chih-Hsun Lin, Chih-Kang Chao | 2013-08-20 |
| 8476629 | Enhanced wafer test line structure | Jiun-Jie Huang, Chi-Yen Lin | 2013-07-02 |
| 8470660 | Method of manufacturing a semiconductor device | Mei-Hsuan Lin, Chih-Kang Chao, Chih-Hsun Lin | 2013-06-25 |
| 8468474 | Reducing metal pits through optical proximity correction | Jiun-Jie Huang, Chi-Yen Lin | 2013-06-18 |
| 8341562 | Reducing metal pits through optical proximity correction | Jiun-Jie Huang, Chi-Yen Lin | 2012-12-25 |
| 8207532 | Constant and reducible hole bottom CD in variable post-CMP thickness and after-development-inspection CD | Chi-An Kao, Yung-Chang Chang, Yu-Ping Chang | 2012-06-26 |