DL

David Lu

TSMC: 18 patents #1,811 of 12,232Top 15%
Overall (All Time): #223,401 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
9698080 Conductor structure for three-dimensional semiconductor device Wen-Chih Chiou 2017-07-04
9130024 Three-dimensional semiconductor device Wen-Chih Chiou 2015-09-08
8822331 Anchored damascene structures Horng-Huei Tseng, Syun-Ming Jang 2014-09-02
8368220 Anchored damascene structures Horng-Huei Tseng, Syun-Ming Jang 2013-02-05
8237209 Capacitors integrated with metal gate formation Chung-Long Chang, Chia-Yi Chen, I-Lu Wu 2012-08-07
8179516 Protective layer on objective lens for liquid immersion lithography applications Burn Jeng Lin 2012-05-15
8178289 System and method for photolithography in semiconductor manufacturing Kuei-Shun Chen, Chin-Hsiang Lin 2012-05-15
8134235 Three-dimensional semiconductor device Wen-Chih Chiou 2012-03-13
8105954 System and method of vapor deposition Chien-Wei Wang, Ching-Yu Chang 2012-01-31
8053865 MOM capacitors integrated with air-gaps Chung-Long Chang, Ming-Shih Yeh, Chia-Yi Chen 2011-11-08
8054444 Lens cleaning module for immersion lithography apparatus Burn Jeng Lin 2011-11-08
8022458 Capacitors integrated with metal gate formation Chung-Long Chang, Chia-Yi Chen, I-Lu Wu 2011-09-20
7924397 Anti-corrosion layer on objective lens for liquid immersion lithography applications Burn Jeng Lin 2011-04-12
7760144 Antennas integrated in semiconductor chips Chung-Long Chang, Shine C. Chung 2010-07-20
7582494 Device structures for reducing device mismatch due to shallow trench isolation induced oxides stresses Shine C. Chung 2009-09-01
7501227 System and method for photolithography in semiconductor manufacturing Kuei-Shun Chen, Chin-Hsiang Lin 2009-03-10
7462561 Contact structure formed using supercritical cleaning fluid and ALCVD Horng-Huei Tseng, Syun-Ming Jang 2008-12-09
7420188 Exposure method and apparatus for immersion lithography Ching-Yu Chang, Chin-Hsiang Lin, Burn Jeng Lin 2008-09-02
7259393 Device structures for reducing device mismatch due to shallow trench isolation induced oxides stresses Shine C. Chung 2007-08-21
7224427 Megasonic immersion lithography exposure apparatus and method Ching-Yu Chang, Chien-Hung Lin, Chin-Hsiang Lin, Horng-Huei Tseng, Burn Jeng Lin 2007-05-29