Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6890772 | Method and apparatus for determining two dimensional doping profiles with SIMS | Jun-Yean Chiou, Pei-Fen Chou, Han-Shun Lui | 2005-05-10 |
| 6403386 | Method and apparatus for identifying failure sites on IC chips | — | 2002-06-11 |
| 6394409 | Real time observable sample mounting fixture | Chih-Jian Chen | 2002-05-28 |
| 6397373 | Efficient design rule check (DRC) review system | Fouriers Tseng | 2002-05-28 |
| 6245683 | Stress relieve pattern for damascene process | — | 2001-06-12 |
| 6121059 | Method and apparatus for identifying failure sites on IC chips | — | 2000-09-19 |
| 5990478 | Method for preparing thin specimens consisting of domains of different materials | — | 1999-11-23 |
| 5963040 | Method and apparatus for detecting pin-holes in a passivation layer | — | 1999-10-05 |
| 5923088 | Bond pad structure for the via plug process | Ruey-Yun Shiue, Wen-Teng Wu, Pi-Chen Shieh | 1999-07-13 |
| 5700735 | Method of forming bond pad structure for the via plug process | Ruey-Yun Shiue, Wen-Teng Wu, Pi-Chen Shieh | 1997-12-23 |