Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6586312 | Method for fabricating a DRAM capacitor and device made | Pin Hsiang Chin | 2003-07-01 |
| 6412104 | Integrated circuit debugging system | — | 2002-06-25 |
| 6407564 | Universal BGA board for failure analysis and method of using | — | 2002-06-18 |
| 6405359 | Method for backside failure analysis requiring simple bias conditions | Thomas Hung | 2002-06-11 |
| 6397373 | Efficient design rule check (DRC) review system | Chin-Kai Liu | 2002-05-28 |
| 6395580 | Backside failure analysis for BGA package | — | 2002-05-28 |
| 6252227 | Method for sectioning a semiconductor wafer with FIB for viewing with SEM | Mei Fun Chen, At Chuan Chen, Huey Ling Chen | 2001-06-26 |
| 5899741 | Method of manufacturing low resistance and low junction leakage contact | Peng-Cheng Chou | 1999-05-04 |