Issued Patents All Time
Showing 26–35 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6897475 | Test structure and related methods for evaluating stress-induced voiding | — | 2005-05-24 |
| 6815971 | Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source | Shih-Liang Wang, Chao-Hao Cheng | 2004-11-09 |
| 6617180 | Test structure for detecting bridging of DRAM capacitors | — | 2003-09-09 |
| 6396751 | Semiconductor device comprising a test structure | Yih-Yuh Doong, Tsu-bin Shen, Sung-Chun Hsieh | 2002-05-28 |
| 6277742 | Method of protecting tungsten plug from corroding | Chingfu Lin, Lien Jung Hung | 2001-08-21 |
| 6258712 | Method for forming a borderless contact | — | 2001-07-10 |
| 6258694 | Fabrication method of a device isolation structure | Ling-Sung Wang | 2001-07-10 |
| 6245667 | Method of forming via | Ling-Sung Wang, Chingfu Lin | 2001-06-12 |
| 6171963 | Method for forming a planar intermetal dielectric using a barrier layer | — | 2001-01-09 |
| 6060786 | Alignment-marker structure and method of forming the same in integrated circuit fabrication | — | 2000-05-09 |