Issued Patents All Time
Showing 51–57 of 57 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8721892 | Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same | Yu-Chong Tai, Jun Xie, Darron K. Young, Po-Jui Chen | 2014-05-13 |
| 8605276 | Enhanced defect scanning | Chih-Jen Wu, Chen-Ming Huang, Kuan-Chieh Huang, Chin-Hsiang Lin | 2013-12-10 |
| 8592287 | Overlay alignment mark and method of detecting overlay alignment error using the mark | I-Hsiung Huang, Heng-Hsin Liu | 2013-11-26 |
| 8574432 | Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same | Yu-Chong Tai, Jun Xie, Darron K. Young, Po-Jui Chen | 2013-11-05 |
| 8183701 | Structure of stacking scatterometry based overlay marks for marks footprint reduction | Sophia Wang, Heng-Hsin Liu, Heng-Jen Lee | 2012-05-22 |
| 7629797 | Resonance-induced sensitivity enhancement method for conductivity sensors | Yu-Chong Tai, Wei Li, Siyang Zheng | 2009-12-08 |
| 7530259 | On-chip temperature controlled liquid chromatography methods and devices | Yu-Chong Tai, Jun Xie, Qing He | 2009-05-12 |