Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8852673 | Defect monitoring for resist layer | Li-Kong Turn, Yung-Yao Lee, Ping-Hsi Yang | 2014-10-07 |
| 7728396 | Semiconductor structures | Hua-Shu Wu, Tsung-Mu Lai, Ming-Chih Chang | 2010-06-01 |
| 7198975 | Semiconductor methods and structures | Hua-Shu Wu, Tsung-Mu Lai, Ming-Chih Chang | 2007-04-03 |