Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12104951 | Photocoupler sensing circuit and operation method thereof | Meng-Jeong Pan | 2024-10-01 |
| 9825454 | Protection device and method for electronic device | Meng-Jeong Pan | 2017-11-21 |
| 7818896 | Sole ventilation system | Kan-zen Hsieh | 2010-10-26 |
| 7003365 | System and method of reserving capacity for a pre-process order | Wei-Kuo Yen, Jen-Lin Chao, Wei-Chuan Huang | 2006-02-21 |
| 6728586 | Microelectronic fabrication production control method and system providing enhanced microelectronic fabrication facility utilization flexibility | Cheng-Hsi Wen, Edwin Liou | 2004-04-27 |
| 6500680 | Service code system and method for scheduling fabrication facility utilization | Yu-Fong Tai, Chun-Yi Tsai | 2002-12-31 |
| 6389323 | Method and system for yield loss analysis by yield management system | Jiunn-Der Yang, Renn-Shyan Yeh, Wen-Chen Chang | 2002-05-14 |
| 6308576 | Method for determining stress effect on a film during scrubber clean | Renn-Shyan Yeh, Der-Fang Huang, Tzu-Yu Lin | 2001-10-30 |
| 6261843 | Test pattern for monitoring metal corrosion on integrated circuit wafers | Hsien-Wen Chang, Chih-Chien Hung, Kuang-Hui Chang | 2001-07-17 |
| 6153497 | Method for determining a cause for defects in a film deposited on a wafer | Renn-Shyan Yeh, Der-Fang Huang, Chih-Chien Hung | 2000-11-28 |
| 6017771 | Method and system for yield loss analysis by yield management system | Jiunn-Der Yang, Renn-Shyan Yeh, Wen-Chen Chang | 2000-01-25 |
| 5877064 | Method for marking a wafer | Yung-Fa Lin | 1999-03-02 |
| 5874309 | Method for monitoring metal corrosion on integrated circuit wafers | Hsien-Wen Chang, Chih-Chien Hung, Kuang-Hui Chang | 1999-02-23 |
| 5783097 | Process to avoid dielectric damage at the flat edge of the water | Chi-Shen Lo, Chia-Hsiang Chen, Hsien-Wen Chang, Chih-Heng Shen | 1998-07-21 |
| 5783493 | Method for reducing precipitate defects using a plasma treatment post BPSG etchback | Rann-Shyan Yeh, Hsien-Wen Chang | 1998-07-21 |