Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6389323 | Method and system for yield loss analysis by yield management system | Jiunn-Der Yang, Chao-Hsin Chang, Wen-Chen Chang | 2002-05-14 |
| 6308576 | Method for determining stress effect on a film during scrubber clean | Der-Fang Huang, Tzu-Yu Lin, Chao-Hsin Chang | 2001-10-30 |
| 6153497 | Method for determining a cause for defects in a film deposited on a wafer | Der-Fang Huang, Chao-Hsin Chang, Chih-Chien Hung | 2000-11-28 |
| 6017771 | Method and system for yield loss analysis by yield management system | Jiunn-Der Yang, Chao-Hsin Chang, Wen-Chen Chang | 2000-01-25 |