| 10621298 |
Automatically generated schematics and visualization |
Anshuman Chandra, Rohit Kapur |
2020-04-14 |
| 10445225 |
Command coverage analyzer |
Chandramouli Gopalakrishnan, Neeraj Surana, Santosh Kulkarni, Rohit Kapur |
2019-10-15 |
| 10067187 |
Handling of undesirable distribution of unknown values in testing of circuit using automated test equipment |
Anshuman Chandra, Jyotirmoy Saikia, Parthajit Bhattacharya, Rohit Kapur |
2018-09-04 |
| 9417287 |
Scheme for masking output of scan chains in test circuit |
Anshuman Chandra, Jyotirmoy Saikia, Parthajit Bhattacharya, Rohit Kapur |
2016-08-16 |
| 9342439 |
Command coverage analyzer |
Chandramouli Gopalakrishnan, Neeraj Surana, Santosh Kulkarni, Rohit Kapur |
2016-05-17 |
| 9239897 |
Hierarchical testing architecture using core circuit with pseudo-interfaces |
Santosh Kulkarni, Anshuman Chandra, Rohit Kapur |
2016-01-19 |