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Embedded memory transparent in-system built-in self-test |
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Detection of address errors in memory devices using multi-segment error detection codes |
Hayk Grigoryan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
2021-06-01 |
| 10789398 |
Method and apparatus for SOC with optimal RSMA |
Suren Martirosyan, Gurgen Harutyunyan, Yervant Zorian |
2020-09-29 |
| 10192635 |
FinFET-based memory testing using multiple read operations |
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
2019-01-29 |
| 10115477 |
FinFET-based memory testing using multiple read operations |
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
2018-10-30 |
| 9831000 |
Testing electronic memories based on fault and test algorithm periodicity |
Aram Hakhumyan, Gurgen Harutyunyan, Valery Vardanian, Yervant Zorian |
2017-11-28 |
| 9514258 |
Generation of memory structural model based on memory layout |
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2016-12-06 |
| 9053050 |
Determining a desirable number of segments for a multi-segment single error correcting coding scheme |
Hayk Grigoryan, Gurgen Harutyunyan, Valery Vardanian, Yervant Zorian |
2015-06-09 |
| 8850277 |
Detecting random telegraph noise induced failures in an electronic memory |
Karen Amirkhanyan, Hayk Grigoryan, Gurgen Harutyunyan, Tatevik Melkumyan, Alex Shubat +2 more |
2014-09-30 |
| 8112730 |
Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilers |
Karen Aleksanyan, Karen Amirkhanyan, Sergey Karapetyan, Alexander Shubat, Valery Vardanian +1 more |
2012-02-07 |
| 7768840 |
Memory modeling using an intermediate level structural description |
Karen Aleksanyan, Karen Amirkhanyan, Valery Vardanian, Yervant Zorian |
2010-08-03 |