Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12266413 | Built-in self-test circuit for row hammering in memory | Gurgen Harutyunyan, Arun Kumar, Yervant Zorian | 2025-04-01 |
| 12094548 | Diagnosing faults in memory periphery circuitry | Gurgen Harutyunyan, Yervant Zorian | 2024-09-17 |
| 12002530 | Embedded memory transparent in-system built-in self-test | Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2024-06-04 |
| 11023310 | Detection of address errors in memory devices using multi-segment error detection codes | Hayk Grigoryan, Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2021-06-01 |
| 10192635 | FinFET-based memory testing using multiple read operations | Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2019-01-29 |
| 10115477 | FinFET-based memory testing using multiple read operations | Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2018-10-30 |