Issued Patents All Time
Showing 26–50 of 94 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8919771 | Sheet conveying apparatus and image forming apparatus | — | 2014-12-30 |
| 8803244 | Semiconductor device | — | 2014-08-12 |
| 8753431 | Bubble removal method and bubble removal device | Shuichi Iwata | 2014-06-17 |
| 8716811 | Semiconductor device | Chihiro Arai | 2014-05-06 |
| 8700498 | Feature analyzing apparatus for a surface of an object | Yoshinori Hayashi, Hiroshi Wakaba, Koichi Miyazono, Yoko Ono | 2014-04-15 |
| 8508246 | Substrate surface inspecting apparatus and substrate surface inspecting method | Hiroshi Wakaba, Yoshinori Hayashi, Koichi Miyazono, Yoko Ono, Shozo KAWASAKI | 2013-08-13 |
| 8497985 | Inspection method based on captured image and inspection device | Yoshinori Hayashi, Hiroshi Wakaba, Yoko Ono, Koichi Miyazono, Masao Kawamura | 2013-07-30 |
| 8488867 | Inspection device for disk-shaped substrate | Yoshinori Hayashi, Hiroshi Wakaba, Yoko Ono, Koichi Miyazono | 2013-07-16 |
| 8463161 | Image forming apparatus having transfer belt spacing mechanism | — | 2013-06-11 |
| 8433102 | Surface roughness inspection system | Yoshinori Hayashi | 2013-04-30 |
| 8382099 | Sheet conveying apparatus and image forming apparatus | — | 2013-02-26 |
| 8300954 | Information processing apparatus and method, and program | Yuya Aoki, Takuo Morimura, Shinobu Yamada, Hirosuke Nagano, Kentaro Fukazawa +4 more | 2012-10-30 |
| 8264600 | Image processing apparatus for converting a lower resolution image into a higher resolution image using cyclic coefficients | Tetsujiro Kondo, Masashi Uchida, Takuo Morimura, Daisuke Kikuchi, Takeshi Miyai +6 more | 2012-09-11 |
| 8227314 | Semiconductor device and manufacturing method of the same | — | 2012-07-24 |
| 8221096 | Compressor arrangement with stator welded to a housing | Hiroyuki Taniwa, Masahide Higuchi, Yasukazu Nabetani, Azusa Ujihara | 2012-07-17 |
| 8208735 | Image processing device, image processing method, learning device, learning method, and program | Kentaro Fukazawa, Takuo Morimura, Shinobu Yamada, Hirosuke Nagano, Yuya Aoki +4 more | 2012-06-26 |
| 8194241 | Apparatus and method for inspecting edge of semiconductor wafer | Yoshinori Hayashi | 2012-06-05 |
| 8111325 | Image processing apparatus and method and program | Tetsujiro Kondo, Takeshi Miyai, Masashi Uchida, Takuo Morimura, Shizuo Chikaoka +2 more | 2012-02-07 |
| 8107064 | Disc wafer inspecting device and inspecting method | Yoshinori Hayashi, Takeki Kogawa, Akimasa Hori | 2012-01-31 |
| 8097914 | Semiconductor device and manufacturing method of the same | — | 2012-01-17 |
| 8094923 | Wafer containing cassette inspection device and method | Yoshinori Hayashi, Takeki Kogawa | 2012-01-10 |
| 8031440 | Coil support structure and magnetic disk drive | Satoshi Matsumura, Takaaki Deguchi, Hiroshi Matsuda | 2011-10-04 |
| 8023111 | Surface inspection apparatus | Yoshinori Hayashi, Masao Kawamura | 2011-09-20 |
| 7944657 | Electrostatic discharge protection circuit | Kentaro Kasai | 2011-05-17 |
| 7781861 | Semiconductor device | Hirokazu Ejiri, Kenji Azami, Terukazu Ohno, Nobuyuki Yoshitake | 2010-08-24 |