Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8700498 | Feature analyzing apparatus for a surface of an object | Yoshinori Hayashi, Koichi Miyazono, Yoko Ono, Hideki Mori | 2014-04-15 |
| 8508246 | Substrate surface inspecting apparatus and substrate surface inspecting method | Yoshinori Hayashi, Koichi Miyazono, Yoko Ono, Hideki Mori, Shozo KAWASAKI | 2013-08-13 |
| 8497985 | Inspection method based on captured image and inspection device | Yoshinori Hayashi, Yoko Ono, Koichi Miyazono, Masao Kawamura, Hideki Mori | 2013-07-30 |
| 8488867 | Inspection device for disk-shaped substrate | Yoshinori Hayashi, Yoko Ono, Koichi Miyazono, Hideki Mori | 2013-07-16 |