Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12286718 | Method for producing nitride semiconductor photoelectrode | Yuya Uzumaki, Sayumi Sato, Takeshi Komatsu | 2025-04-29 |
| 12107218 | Lithium secondary battery | Shuhei Sakamoto, Hironobu Minowa, Takeshi Komatsu | 2024-10-01 |
| 12074288 | Lithium secondary battery | Shuhei Sakamoto, Hironobu Minowa, Takeshi Komatsu | 2024-08-27 |
| 12036526 | Carbon dioxide reduction device | Sayumi Sato, Yuya Uzumaki, Takeshi Komatsu | 2024-07-16 |
| 11961960 | Lithium secondary battery | Shuhei Sakamoto, Masahiko Hayashi, Takeshi Komatsu | 2024-04-16 |
| 11888141 | Air battery and detection device | Hiroaki Taguchi, Takeshi Komatsu, Yuzu Kobayashi, Mikayo Iwata, Masaya Nohara | 2024-01-30 |
| 11876207 | Battery and method of manufacturing cathode of the same | Masaya Nohara, Mikayo Iwata, Masahiko Hayashi, Takeshi Komatsu | 2024-01-16 |
| 11642504 | Sheet mask comprising a battery part | Takeshi Komatsu, Masaya Nohara, Masahiko Hayashi, Shuhei Sakamoto, Yuya Uzumaki +1 more | 2023-05-09 |
| 11560637 | Electrolytic reduction device and electrolytic reduction method | Sayumi Sato, Yuya Uzumaki, Takeshi Komatsu | 2023-01-24 |
| 11441748 | Lighting device | Hironobu Minowa, Shuhei Sakamoto, Takeshi Komatsu | 2022-09-13 |
| 11374219 | Primary battery and moisture sensor | Masaya Nohara, Mikayo Iwata, Masahiko Hayashi, Takeshi Komatsu | 2022-06-28 |
| 8700498 | Feature analyzing apparatus for a surface of an object | Yoshinori Hayashi, Hiroshi Wakaba, Koichi Miyazono, Hideki Mori | 2014-04-15 |
| 8508246 | Substrate surface inspecting apparatus and substrate surface inspecting method | Hiroshi Wakaba, Yoshinori Hayashi, Koichi Miyazono, Hideki Mori, Shozo KAWASAKI | 2013-08-13 |
| 8497985 | Inspection method based on captured image and inspection device | Yoshinori Hayashi, Hiroshi Wakaba, Koichi Miyazono, Masao Kawamura, Hideki Mori | 2013-07-30 |
| 8488867 | Inspection device for disk-shaped substrate | Yoshinori Hayashi, Hiroshi Wakaba, Koichi Miyazono, Hideki Mori | 2013-07-16 |
| 7109660 | Plasma processing device and baffle plate thereof | Hiroyuki Ishihara, Youichi Araki, Toshiki Takahashi, Takuya Kubo, Atsushi Ito | 2006-09-19 |