Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8107064 | Disc wafer inspecting device and inspecting method | Yoshinori Hayashi, Takeki Kogawa, Hideki Mori | 2012-01-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8107064 | Disc wafer inspecting device and inspecting method | Yoshinori Hayashi, Takeki Kogawa, Hideki Mori | 2012-01-31 |