Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
WH

William Howland — 23 Patents

SMSolid State Measurements: 18 patents #1 of 19Top 6%
KIKeithley Instruments: 1 patents #36 of 82Top 45%
UEU.S. Department Of Energy: 1 patents #118 of 559Top 25%
Kla-Tencor: 1 patents #1,804 of 2,049Top 90%
Wexford, PA: #22 of 413 inventorsTop 6%
Pennsylvania: #2,808 of 74,527 inventorsTop 4%
Overall (All Time): #178,160 of 4,157,543Top 5%
23 Patents All Time
William Howland has been granted 23 US patents while listed as an inventor at Solid State Measurements. The first was granted in 2003 and the most recent in March 2019. William Howland ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list William Howland in Wexford, PA, US.

Patents per Year

Patents granted per year, 2003 to 2019Bar chart with a peak of 5 patents in 2004.peak 52003: 3 patents20032004: 5 patents20042005: 4 patents20052006: 5 patents20062007: 5 patents20072019: 1 patents2019

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10241018 Wear test apparatus Paolo R. Zafred 2019-03-26
7304490 In-situ wafer and probe desorption using closed loop heating Brian R. Bobrzynski 2007-12-04
7282941 Method of measuring semiconductor wafers with an oxide enhanced probe 2007-10-16
7250313 Method of detecting un-annealed ion implants 2007-07-31
7230443 Non-contact mobile charge measurement with leakage band-bending and dipole correction Min-Su Fung, Roger L. Verkuil, Gregory S. Horner 2007-06-12 $65,315,000
7190186 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer Brian R. Bobrzynski 2007-03-13
7063992 Semiconductor substrate surface preparation using high temperature convection heating Michael J. Adams, James Healy 2006-06-20
7026837 Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer Christine E. Kalnas 2006-04-11
7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof Robert J. Hillard, Steven Hung 2006-04-04
7007408 Method and apparatus for removing and/or preventing surface contamination of a probe James Healy 2006-03-07
7005307 Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer Robert J. Hillard 2006-02-28
6972582 Apparatus and method for measuring semiconductor wafer electrical properties Robert Mazur 2005-12-06
6937050 Non-contact mobile charge measurement with leakage band-bending and dipole correction Min-Su Fung, Roger L. Verkuil, Gregory S. Horner 2005-08-30
6894519 Apparatus and method for determining electrical properties of a semiconductor wafer 2005-05-17
6842029 Non-invasive electrical measurement of semiconductor wafers 2005-01-11
6836139 Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer 2004-12-28
6803780 Sample chuck with compound construction Michael J. Adams, William J. Alexander, III 2004-10-12
6788076 Apparatus for determining doping concentration of a semiconductor wafer 2004-09-07
6771092 Non-contact mobile charge measurement with leakage band-bending and dipole correction Min-Su Fung, Roger L. Verkuil, Gregory S. Horner 2004-08-03
6741093 Method of determining one or more properties of a semiconductor wafer Robert J. Hillard 2004-05-25
6657454 High speed threshold voltage and average surface doping measurements 2003-12-02
6632691 Apparatus and method for determining doping concentration of a semiconductor wafer 2003-10-14
6522158 Non-contact mobile charge measurement with leakage band-bending and dipole correction Min-Su Fung, Roger L. Verkuil, Gregory S. Horner 2003-02-18 $1,698,000