William Howland — 23 Patents at Solid State Measurements

William Howland has been granted 23 US patents while listed as an inventor at Solid State Measurements. The first was granted in 2003 and the most recent in March 2019. William Howland ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list William Howland in Wexford, PA, US.

Patents per Year

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
10241018	Wear test apparatus	Paolo R. Zafred	2019-03-26
7304490	In-situ wafer and probe desorption using closed loop heating	Brian R. Bobrzynski	2007-12-04
7282941	Method of measuring semiconductor wafers with an oxide enhanced probe	—	2007-10-16
7250313	Method of detecting un-annealed ion implants	—	2007-07-31
7230443	Non-contact mobile charge measurement with leakage band-bending and dipole correction	Min-Su Fung, Roger L. Verkuil, Gregory S. Horner	2007-06-12	$65,315,000
7190186	Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer	Brian R. Bobrzynski	2007-03-13
7063992	Semiconductor substrate surface preparation using high temperature convection heating	Michael J. Adams, James Healy	2006-06-20
7026837	Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer	Christine E. Kalnas	2006-04-11
7023231	Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof	Robert J. Hillard, Steven Hung	2006-04-04
7007408	Method and apparatus for removing and/or preventing surface contamination of a probe	James Healy	2006-03-07
7005307	Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer	Robert J. Hillard	2006-02-28
6972582	Apparatus and method for measuring semiconductor wafer electrical properties	Robert Mazur	2005-12-06
6937050	Non-contact mobile charge measurement with leakage band-bending and dipole correction	Min-Su Fung, Roger L. Verkuil, Gregory S. Horner	2005-08-30
6894519	Apparatus and method for determining electrical properties of a semiconductor wafer	—	2005-05-17
6842029	Non-invasive electrical measurement of semiconductor wafers	—	2005-01-11
6836139	Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer	—	2004-12-28
6803780	Sample chuck with compound construction	Michael J. Adams, William J. Alexander, III	2004-10-12
6788076	Apparatus for determining doping concentration of a semiconductor wafer	—	2004-09-07
6771092	Non-contact mobile charge measurement with leakage band-bending and dipole correction	Min-Su Fung, Roger L. Verkuil, Gregory S. Horner	2004-08-03
6741093	Method of determining one or more properties of a semiconductor wafer	Robert J. Hillard	2004-05-25
6657454	High speed threshold voltage and average surface doping measurements	—	2003-12-02
6632691	Apparatus and method for determining doping concentration of a semiconductor wafer	—	2003-10-14
6522158	Non-contact mobile charge measurement with leakage band-bending and dipole correction	Min-Su Fung, Roger L. Verkuil, Gregory S. Horner	2003-02-18	$1,698,000

William Howland — 23 Patents

Patents per Year

Issued Patents All Time

Patent Widget