Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7327155 | Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials | — | 2008-02-05 |
| 7295022 | Method and system for automatically determining electrical properties of a semiconductor wafer or sample | Louison Tan | 2007-11-13 |
| 7037734 | Method and apparatus for determining generation lifetime of product semiconductor wafers | — | 2006-05-02 |
| 7023231 | Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof | William Howland, Steven Hung | 2006-04-04 |
| 7005307 | Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer | William Howland | 2006-02-28 |
| 6991948 | Method of electrical characterization of a silicon-on-insulator (SOI) wafer | — | 2006-01-31 |
| 6879176 | Conductance-voltage (GV) based method for determining leakage current in dielectrics | — | 2005-04-12 |
| 6741093 | Method of determining one or more properties of a semiconductor wafer | William Howland | 2004-05-25 |
| 6492827 | Non-invasive electrical measurement of semiconductor wafers | Robert Mazur | 2002-12-10 |
| 6150832 | Noncontact capacitance measuring device | Robert Mazur | 2000-11-21 |
| 5023561 | Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer | — | 1991-06-11 |