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Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
— |
2008-02-05 |
| 7295022 |
Method and system for automatically determining electrical properties of a semiconductor wafer or sample |
Louison Tan |
2007-11-13 |
| 7037734 |
Method and apparatus for determining generation lifetime of product semiconductor wafers |
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2006-05-02 |
| 7023231 |
Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |
William Howland, Steven Hung |
2006-04-04 |
| 7005307 |
Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer |
William Howland |
2006-02-28 |
| 6991948 |
Method of electrical characterization of a silicon-on-insulator (SOI) wafer |
— |
2006-01-31 |
| 6879176 |
Conductance-voltage (GV) based method for determining leakage current in dielectrics |
— |
2005-04-12 |
| 6741093 |
Method of determining one or more properties of a semiconductor wafer |
William Howland |
2004-05-25 |
| 6492827 |
Non-invasive electrical measurement of semiconductor wafers |
Robert Mazur |
2002-12-10 |
| 6150832 |
Noncontact capacitance measuring device |
Robert Mazur |
2000-11-21 |
| 5023561 |
Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer |
— |
1991-06-11 |