Robert J. Hillard — 11 Patents at Solid State Measurements

Robert J. Hillard has been granted 11 US patents while listed as an inventor at Solid State Measurements. The first was granted in 1991 and the most recent in February 2008. Robert J. Hillard ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Robert J. Hillard in Ross Township, PA, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date
7327155	Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials	—	2008-02-05
7295022	Method and system for automatically determining electrical properties of a semiconductor wafer or sample	Louison Tan	2007-11-13
7037734	Method and apparatus for determining generation lifetime of product semiconductor wafers	—	2006-05-02
7023231	Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof	William Howland, Steven Hung	2006-04-04
7005307	Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer	William Howland	2006-02-28
6991948	Method of electrical characterization of a silicon-on-insulator (SOI) wafer	—	2006-01-31
6879176	Conductance-voltage (GV) based method for determining leakage current in dielectrics	—	2005-04-12
6741093	Method of determining one or more properties of a semiconductor wafer	William Howland	2004-05-25
6492827	Non-invasive electrical measurement of semiconductor wafers	Robert Mazur	2002-12-10
6150832	Noncontact capacitance measuring device	Robert Mazur	2000-11-21
5023561	Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer	—	1991-06-11

Robert J. Hillard — 11 Patents

Issued Patents All Time

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