Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7295022 | Method and system for automatically determining electrical properties of a semiconductor wafer or sample | Robert J. Hillard | 2007-11-13 |
{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Solid State Measurements", "item": "https://www.patentleaderboard.com/company/solid-state-measurements"}, {"@type": "ListItem", "position": 3, "name": "Louison Tan", "item": "https://www.patentleaderboard.com/inventor/fl:lo_ln:tan-12"}]}
Skip to contentShowing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7295022 | Method and system for automatically determining electrical properties of a semiconductor wafer or sample | Robert J. Hillard | 2007-11-13 |