CK

Christine E. Kalnas

SM Solid State Measurements: 1 patents #12 of 19Top 65%
Overall (All Time): #3,413,228 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7026837 Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer William Howland 2006-04-11