Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7304490 | In-situ wafer and probe desorption using closed loop heating | William Howland | 2007-12-04 |
| 7190186 | Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer | William Howland | 2007-03-13 |